NTE3881
Integrated Circuit NMOS, Parallel I/O Interface (PIO), 4MHz

Description:
The NTE3881 Parallel I/O Circuit (PIO) is a programmable, two port device which provides a TTL compatible interface between peripheral devices and the NTE3880. The Central Processing Unit (CPU) can configure the NTE3881 to interface with a wide range of peripheral devices with no other external logic required. Typical peripheral devices that are fully compatible with the NTE3881 include most keyboard, paper tape readers and punches, printers, PROM programmers, etc. The NTE3881 utilizes N channel silicon gate depletion load technology and is packaged in a 40-Lead DIP type package.

Features:
- Two Independent 8-Bit Bidirectional Peripheral Interface Ports with “Handshake” Data Transfer Control
- Interrupt Driven “Handshake” for Fast Response
- Any One of Four Distinct Modes of Operation may be Selected for a Port, including:
Byte Output
Byte Input
Byte Bidirectional Bus (Available on Port A Only)
Bit Control Mode
- All with Interrupt Controlled Handshake
- Daisy Chain Priority Interrupt Logic Included to Provide for Automatic Interrupt Vectoring without
External Logic
- Eight Outputs are Capable of Driving Darlington Transistors
- All Inputs and Outputs Fully TTL Compatible
- Single 5 Volt Supply and Single Phase Clock Required

Info as pdf-file
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Absolute Maximum Ratings:
Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0° to +70°C
Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65° to +150°C
Voltage On Any Pin With Respect to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to +7V
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6W

Note 1. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only functional operation of the device at these or any other condition above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.


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